By ASM International
The elemental rules of every procedure in addition to its corresponding functions are defined in 23 separate articles. designated details is supplied on frequent tools similar to liquid penetrant, magnetic particle, eddy present and radiographic inspection, electronic photograph enhancement, ultrasonic inspection, tomography, and real-time radiography.
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Example text
Fig. 7 Schematic of a two-frequency laser interferometer The measurement beam is directed through the interferometer to reflect off a moving optical element, which may be a target mirror or retroreflector attached to the item being measured. The reference beam is reflected from a stationary optical element, which is usually a retroreflector. The measurement beam then returns to the interferometer, where it is recombined with the reference beam and directed to the receiver. Whenever the measurement target mirror or retroreflector moves, the accompanying Doppler effect induces a frequency shift in the returning beam.
Environmental factors are critical to the satisfactory performance of any CMM. The user who fails to provide a suitable environment will almost certainly be disappointed with the performance of the machine. Manufacturers will provide potential buyers with environmental guidelines for the operation of the unit, and these guidelines may vary somewhat from manufacturer to manufacturer. In no case will the manufacturer guarantee the performance of the CMM unless the environmental criteria are met. 12 standard for performance evaluation of CMMs, the user has the clear responsibility of providing a suitable performance test environment (on which to base acceptance of the machine from the supplier), either by meeting the guidelines of the supplier or by accepting reduced performance.
A cantilever design, on the other hand, presents some inherent problems associated with isolating the CMM from floor vibrations and maintaining high precision due to the overhanging unsupported arm. Cantilever-type CMMs employ three movable components moving along mutually perpendicular guideways. The probe is attached to the first component, which moves vertically (z-direction) relative to the second. The second component moves horizontally (y-direction) relative to the third. The third component is supported at one end only, cantilever fashion, and moves horizontally (x-direction) relative to the machine base.
